Job Description: • Develop wafer level cost effective test solution for BST ASIC mass production, including test program and test hardware • Support test plan definition for IC production and characterization test and discuss with designer about test feasibility; • Define the tester configuration on the target ATE platform based the test requirement • Enable the final mass production environment at OSAT. • Develop wafer level/sample level test solution for BST ASIC Characterization, including test program and test hardware, support the Characterization data analysis & report generation. • Continuous improve the test work flow, tool sets and methodology. • Work closely across multiple internal/ external teams to ensure test solution alignment across all stages of product life. • Support test cost reduction in mass-production phase. Job Qualification: • Major in EE, Microelectronics, CS or related, BSEE required, MSEE preferred • 3+ years’ experience with one ATE mainstream tester among 93K/J750/Ultraflex/D10/DX ,V93k platform are preferred; • Strong knowledge in Digital/Analog circuit and circuit test methodology. • Fast learner and good team player • Willingness to work and interact in international teams • C/C++/VB/Perl/Python programming skill • Fluent in both written and spoken English • Low percent international business travel to engineering sites in Stuttgart, Munich, Dresden and Milano